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|
TH1: Combinatorial
Testing Explained |
| Veranstalter: |
Peter Zimmerer (Siemens) |
| Datum: |
Dienstag, 27.
März 2007, 9:00 - 12:30 |
| Raum: |
t.b.a. |
| |
|
| Zusammenfassung |
Good test designs often require testing many
different sets of valid and invalid input parameters, hardware/software
environments, and system conditions. This results in a combinatorial
explosion of test cases. For example, testing different combinations of
possible hardware and software components on a typical PC could involve
hundreds or even thousands of possible tests. The classic question for
effective testing is always, Given limited time and resources, which of
the combinations should be tested?
This tutorial describes the underlying problems and challenges in test
case design for combinatorial testing and explains solutions using
different testing techniques. An overview about supporting tools (free
as well as commercial) including their features, characteristics and
usage scenarios is given. Furthermore, successful experiences gained
from real-world projects using the right tools are presented which
clearly show the necessity and benefits of these testing techniques.
Outline:
Contents
1. Introduction Examples and problem statement
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Example developer unit testing
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Example system black-box testing
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Example configuration testing
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Problem statement: Combinatorial testing
2. Method
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Approach
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Example
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Benefits
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Usage scenarios
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Approaches for automated calculation
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Orthogonal arrays and covering arrays
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Heuristic algorithms
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Influences and dependencies
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Points to watch and limitations
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Additional requirements
3. Real-world example installation testing
4. Tools
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AETG Web Service (Telcordia)
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AllPairs (James Bach)
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CTE XL (DaimlerChrysler)
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Combinatorial Test Services CTS (IBM alphaWorks)
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IBM Intelligent Test Case Handler (IBM alphaWorks)
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Jenny (Bob Jenkins)
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Pairwise Independent Combinatorial Testing PICT
(Microsoft)
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Pro-Test (SigmaZone)
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TConfig (Alan Williams)
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Tool characteristics, calculation results and
experiences
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Demo
5. References
6. Summary |